• DocumentCode
    3138053
  • Title

    Stochastic Synapse with Short-Term Depression for Silicon Neurons

  • Author

    Xu, Peng ; Horiuchi, Timothy K. ; Sarje, Anshu ; Abshire, Pamela

  • Author_Institution
    Maryland Univ., College Park
  • fYear
    2007
  • fDate
    27-30 Nov. 2007
  • Firstpage
    99
  • Lastpage
    102
  • Abstract
    We report a stochastic dynamical synapse for VLSI spiking neural systems. The compactness of the circuit, real-time stochastic behavior, and probability tuning make it well suitable to implement stochastic synapses with variety of dynamics. The stochastic synapse implements short-term depression (STD) using a subtractive single release model. Preliminary experimental results show a good match with theoretical predictions. The output from the stochastic synapse with STD has negative autocorrelation and lower power spectral density at low frequencies which can remove the information redundancy in the input spike train. The mean transmission probability is inversely proportional to the input spike rate which has been suggested as an automatic gain control mechanism in neural systems. The silicon stochastic synapse with plasticity could potentially be a powerful addition to existing deterministic VLSI spiking neural systems.
  • Keywords
    VLSI; automatic gain control; neural nets; silicon; stochastic processes; VLSI spiking neural system; automatic gain control mechanism; information redundancy; negative autocorrelation; short-term depression; silicon neurons; spectral density; stochastic dynamical synapse; synaptic plasticity; synaptic transmission probability; Autocorrelation; Circuit optimization; Frequency; Gain control; Neurons; Power system modeling; Silicon; Stochastic processes; Stochastic systems; Very large scale integration; Short-term depression (STD); spike; stochastic synapse; synaptic plasticity; synaptic transmission;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Biomedical Circuits and Systems Conference, 2007. BIOCAS 2007. IEEE
  • Conference_Location
    Montreal, Que.
  • Print_ISBN
    978-1-4244-1524-3
  • Electronic_ISBN
    978-1-4244-1525-0
  • Type

    conf

  • DOI
    10.1109/BIOCAS.2007.4463318
  • Filename
    4463318