Title :
Selective MOVPE growth of InGaAsP and InGaAs using TBA and TBP
Author :
Sakata, Y. ; Nakamura, T. ; Ae, S. ; Terakado, T. ; Inomoto, Y. ; Torikai, T. ; Hasumi, H.
Author_Institution :
ULSI Device Dev. Lab., NEC Corp., Shiga, Japan
Abstract :
Selective MOVPE growth of InGaAs(P) on mask-patterned InP substrate using tertiarybutylarsine and tertiarybutylphosphine (TBA/TBP) was investigated for the first time. Selective growth was achieved with no polycrystal on the SiOx masks. Several compositions of InGaAs(P) were selectively grown and the bandgap wavelength shifts were evaluated against the mask width. Larger photoluminescence wavelength shift was observed with longer bandgap wavelength InGaAs(P). From the measurement of growth rate enhancement, vapor phase lateral diffusion length was estimated for several InGaAs(P) with various V/III ratios. It was made clear that the lateral diffusion length of group III species using TBA/TBP can be widely controlled over the wide range of V/III ratio, even for low V/III ratios. From this feature, selective MQW growth using TBA/TBP has better bandgap controllability than that using AsH3/PH3 so that it is extensively expected to realize the high performance integrated MQW optical waveguide devices
Keywords :
III-V semiconductors; energy gap; gallium arsenide; indium compounds; photoluminescence; semiconductor epitaxial layers; semiconductor growth; semiconductor quantum wells; vapour phase epitaxial growth; InGaAs; InGaAsP; InP; TBA; TBP; V/III ratios; bandgap controllability; bandgap wavelength shifts; growth rate enhancement; high performance integrated MQW optical waveguide devices; mask width; mask-patterned InP substrate; selective MOVPE growth; tertiarybutylarsine; tertiarybutylphosphine; vapor phase lateral diffusion length; Epitaxial growth; Epitaxial layers; Indium gallium arsenide; Indium phosphide; Length measurement; Optical devices; Optical waveguides; Photoluminescence; Photonic band gap; Quantum well devices;
Conference_Titel :
Indium Phosphide and Related Materials, 1995. Conference Proceedings., Seventh International Conference on
Conference_Location :
Hokkaido
Print_ISBN :
0-7803-2147-2
DOI :
10.1109/ICIPRM.1995.522275