Title :
Extended factors for linear contingency analysis
Author :
Sauer, Peter W. ; Reinhard, Karl E. ; Overbye, Thomas J.
Author_Institution :
University of Illinois at Urbana-Champaign
Keywords :
Admittance; History; Linear approximation; Power generation; Relays; Security; Shafts; Steady-state; Testing; Voltage;
Conference_Titel :
System Sciences, 2001. Proceedings of the 34th Annual Hawaii International Conference on
Conference_Location :
Maui, HI, USA
Print_ISBN :
0-7695-0981-9
DOI :
10.1109/HICSS.2001.926271
