• DocumentCode
    3140797
  • Title

    A Maximal Resolution Guided-Probe Testing Algorithm

  • Author

    Abramovici, Miron

  • Author_Institution
    Bell Telephone Laboratories, Naperville, IL
  • fYear
    1981
  • fDate
    29-1 June 1981
  • Firstpage
    189
  • Lastpage
    195
  • Abstract
    The existing guided-probe testing procedures employ a simple strategy of following error path(s). This strategy may fail to locate faults (or may produce a wrong diagnostic) in the following situations: 1. Faults affecting lines connected to buses or wired-or junctions. 2. Faults whose error paths form closed asynchronous loops. 3. Faults which generate pseudo-intermittent symptoms. 4. Faults which do not propagate errors to the probed points. In this paper we introduce a new guided-probe algorithm which overcomes these difficulties. Our algorithm always achieves the maximal diagnostic resolution obtainable under the applied test.
  • Keywords
    Asynchronous circuits; Circuit faults; Circuit testing; Dictionaries; Fault detection; Fault diagnosis; Fault location; Laboratories; Performance analysis; Telephony;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation, 1981. 18th Conference on
  • Type

    conf

  • DOI
    10.1109/DAC.1981.1585351
  • Filename
    1585351