DocumentCode
3140797
Title
A Maximal Resolution Guided-Probe Testing Algorithm
Author
Abramovici, Miron
Author_Institution
Bell Telephone Laboratories, Naperville, IL
fYear
1981
fDate
29-1 June 1981
Firstpage
189
Lastpage
195
Abstract
The existing guided-probe testing procedures employ a simple strategy of following error path(s). This strategy may fail to locate faults (or may produce a wrong diagnostic) in the following situations: 1. Faults affecting lines connected to buses or wired-or junctions. 2. Faults whose error paths form closed asynchronous loops. 3. Faults which generate pseudo-intermittent symptoms. 4. Faults which do not propagate errors to the probed points. In this paper we introduce a new guided-probe algorithm which overcomes these difficulties. Our algorithm always achieves the maximal diagnostic resolution obtainable under the applied test.
Keywords
Asynchronous circuits; Circuit faults; Circuit testing; Dictionaries; Fault detection; Fault diagnosis; Fault location; Laboratories; Performance analysis; Telephony;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation, 1981. 18th Conference on
Type
conf
DOI
10.1109/DAC.1981.1585351
Filename
1585351
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