Title :
Functional Level Simulation in FANSIM3 - Algorithms, Data Structures and Results
Author :
Hirschhorn, S.S. ; Hommel, M.B. ; Bures, C.
Author_Institution :
GTE Laboratories Incorporated, Waltham, MA
Abstract :
This paper discusses the functional level logic simulation techniques used in the FANSIM3 simulator. The data structures for function evaluation and the algorithms used to simulate functional models are presented. The methods used to simulate datapaths and bussed signals are also discussed. Specific results, based on a year´s experience with the simulator, are presented.
Keywords :
Circuit faults; Circuit simulation; Circuit testing; Data structures; Databases; Delay; Discrete event simulation; Logic devices; Logic testing; Timing;
Conference_Titel :
Design Automation, 1981. 18th Conference on
DOI :
10.1109/DAC.1981.1585359
