DocumentCode
3141177
Title
State-of-art, challenges and future directions in large signal measurements for active device modeling
Author
Schreurs, Dominique
Author_Institution
K.U.Leuven, Belgium
fYear
2010
fDate
23-28 May 2010
Firstpage
1
Lastpage
1
Abstract
Vector non-linear measurements emerged two decades ago, initiating a vast range of novel applications in microwave characterisation, modeling, and design. This paper focuses on its impact on microwave active device modeling. After sketching the evolution in instrumentation, the present capabilities are described. Today´s developments are happening swiftly and on a large scale. As communication becomes more low-power, more wireless, and more bandwidth demanding, requirements for device models have evolved as well. In this paper, the present challenges in modeling and thus directions in instrumentation development are discussed.
Keywords
Bandwidth; Instruments; Large-scale systems; Microwave communication; Microwave devices; Microwave measurements; Signal design;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest (MTT), 2010 IEEE MTT-S International
Conference_Location
Anaheim, CA
ISSN
0149-645X
Print_ISBN
978-1-4244-6056-4
Electronic_ISBN
0149-645X
Type
conf
DOI
10.1109/MWSYM.2010.5517498
Filename
5517498
Link To Document