DocumentCode
314126
Title
Thin Teflon-like films for eliminating adhesion in released polysilicon microstructures
Author
Smith, Bradley K. ; Sniegowski, Jeffiy J. ; LaVigne, Glenn
Author_Institution
Sandia Nat. Labs., Albuquerque, NM, USA
Volume
1
fYear
1997
fDate
16-19 Jun 1997
Firstpage
245
Abstract
This paper presents a method for depositing thin Teflon-like films using a commercial plasma reactor to eliminate adhesion or stiction in released polysilicon microstructures. A Lam 384T oxide etch system is used in a remote plasma mode with commercially available trifluoromethane (CHF3) to deposit thin hydrophobic films around and under released microstructures. Hard, uniform, Teflon-like films which penetrate into undercuts beneath structures have been produced. Thus far, surfaces beneath gears as large as 1600 micron diameter with a gap of 2.0 microns are hydrophobic after being exposed to plasma treatment. These Teflon-like coatings have been shown to reduce the coefficient of friction from 1.0 to 0.07
Keywords
adhesion; elemental semiconductors; micromechanical devices; plasma deposited coatings; polymer films; silicon; sliding friction; sputter etching; wear resistant coatings; Lam 384T oxide etch system; Si; adhesion elimination; coefficient of friction reduction; commercial plasma reactor; gears; released polysilicon microstructures; remote plasma mode; stiction elimination; thin Teflon-like films; thin hydrophobic films; trifluoromethane; undercut penetration; Adhesives; Etching; Feeds; Inductors; Microstructure; Plasma accelerators; Plasma applications; Polymer films; Substrates; Surface treatment;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid State Sensors and Actuators, 1997. TRANSDUCERS '97 Chicago., 1997 International Conference on
Conference_Location
Chicago, IL
Print_ISBN
0-7803-3829-4
Type
conf
DOI
10.1109/SENSOR.1997.613629
Filename
613629
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