DocumentCode :
3141884
Title :
Transfer defect learning
Author :
Jaechang Nam ; Pan, Sinno Jialin ; Sunghun Kim
Author_Institution :
Dept. of Comput. Sci. & Eng., Hong Kong Univ. of Sci. & Technol., Hong Kong, China
fYear :
2013
fDate :
18-26 May 2013
Firstpage :
382
Lastpage :
391
Abstract :
Many software defect prediction approaches have been proposed and most are effective in within-project prediction settings. However, for new projects or projects with limited training data, it is desirable to learn a prediction model by using sufficient training data from existing source projects and then apply the model to some target projects (cross-project defect prediction). Unfortunately, the performance of cross-project defect prediction is generally poor, largely because of feature distribution differences between the source and target projects. In this paper, we apply a state-of-the-art transfer learning approach, TCA, to make feature distributions in source and target projects similar. In addition, we propose a novel transfer defect learning approach, TCA+, by extending TCA. Our experimental results for eight open-source projects show that TCA+ significantly improves cross-project prediction performance.
Keywords :
learning (artificial intelligence); public domain software; software engineering; TCA+; cross-project defect prediction; feature distributions; open-source projects; software defect prediction approaches; source projects; transfer defect learning; within-project prediction settings; Data models; Measurement; Predictive models; Software; Standards; Training; Vectors; cross-project defect prediction; empirical software engineering; transfer learning;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Software Engineering (ICSE), 2013 35th International Conference on
Conference_Location :
San Francisco, CA
Print_ISBN :
978-1-4673-3073-2
Type :
conf
DOI :
10.1109/ICSE.2013.6606584
Filename :
6606584
Link To Document :
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