• DocumentCode
    314197
  • Title

    Thin beam bulk micromachining based on RIE and xenon difluoride silicon etching

  • Author

    Toda, Risaku ; Minami, Kazuyuki ; Esashi, Masayoshi

  • Author_Institution
    Fac. of Eng., Tohoku Univ., Sendai, Japan
  • Volume
    1
  • fYear
    1997
  • fDate
    16-19 Jun 1997
  • Firstpage
    671
  • Abstract
    A new process for fabricating thin mechanical beam structures from single crystal silicon is developed. Lateral and vertical dimensions of the beam can be precisely defined. The beam is positioned in the middle of a silicon wafer at exactly equal distances from both sides. The beam design is not limited by crystal orientations of silicon. The silicon beam structure is essentially stress-free because the whole structure is made of uniformly doped single crystal silicon. This thin beam process offers significantly expanded design freedom to bulk silicon micromachining. Additionally, a very high aspect ratio silicon dioxide structure can be fabricated with a similar technique
  • Keywords
    elemental semiconductors; etching; micromachining; micromechanical devices; silicon; sputter etching; RIE; Si; Si thin beam bulk micromachining; Si-SiO2; XeF2; XeF2 etching; beam design; lateral dimensions; single crystal Si; thin mechanical beam structures; vertical dimensions; very high aspect ratio SiO2 structure; Dry etching; Fabrication; Mechanical systems; Micromachining; Microstructure; Oxidation; Silicon compounds; Solids; Strips; Xenon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid State Sensors and Actuators, 1997. TRANSDUCERS '97 Chicago., 1997 International Conference on
  • Conference_Location
    Chicago, IL
  • Print_ISBN
    0-7803-3829-4
  • Type

    conf

  • DOI
    10.1109/SENSOR.1997.613741
  • Filename
    613741