DocumentCode
314197
Title
Thin beam bulk micromachining based on RIE and xenon difluoride silicon etching
Author
Toda, Risaku ; Minami, Kazuyuki ; Esashi, Masayoshi
Author_Institution
Fac. of Eng., Tohoku Univ., Sendai, Japan
Volume
1
fYear
1997
fDate
16-19 Jun 1997
Firstpage
671
Abstract
A new process for fabricating thin mechanical beam structures from single crystal silicon is developed. Lateral and vertical dimensions of the beam can be precisely defined. The beam is positioned in the middle of a silicon wafer at exactly equal distances from both sides. The beam design is not limited by crystal orientations of silicon. The silicon beam structure is essentially stress-free because the whole structure is made of uniformly doped single crystal silicon. This thin beam process offers significantly expanded design freedom to bulk silicon micromachining. Additionally, a very high aspect ratio silicon dioxide structure can be fabricated with a similar technique
Keywords
elemental semiconductors; etching; micromachining; micromechanical devices; silicon; sputter etching; RIE; Si; Si thin beam bulk micromachining; Si-SiO2; XeF2; XeF2 etching; beam design; lateral dimensions; single crystal Si; thin mechanical beam structures; vertical dimensions; very high aspect ratio SiO2 structure; Dry etching; Fabrication; Mechanical systems; Micromachining; Microstructure; Oxidation; Silicon compounds; Solids; Strips; Xenon;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid State Sensors and Actuators, 1997. TRANSDUCERS '97 Chicago., 1997 International Conference on
Conference_Location
Chicago, IL
Print_ISBN
0-7803-3829-4
Type
conf
DOI
10.1109/SENSOR.1997.613741
Filename
613741
Link To Document