DocumentCode
314205
Title
High-yield wafer chuck for single-sided wet etching of MEMS structures
Author
Brugger, J. ; Beljakovic, G. ; Despont, M. ; Biebuyck, H. ; de Rooij, N.F. ; Vettiger, P.
Author_Institution
Zurich Res. Lab., IBM Res. Div., Switzerland
Volume
1
fYear
1997
fDate
16-19 Jun 1997
Firstpage
711
Abstract
We describe a new O-ring setup for wet etching processes. The low-cost approach using siloxane-based sealing rings has been successful for the single-sided etching of silicon and silicon dioxide using a reduced volume of KOH and BHF, respectively. With this approach, the previously fabricated device elements on the reverse wafer side are not damaged. The etchant was heated by an infrared lamp. The achieved etch control allowed the fabrication of membranes only 5 μm thick with good accuracy using an etch stop layer
Keywords
circuit optimisation; etching; integrated circuit yield; membranes; micromechanical devices; process control; seals (stoppers); 5 mum; BHF; HF; KOH; MEMS structures; O-ring setup; Si; SiO2; buffered hydrofluoric acid; etch control; etch stop layer; high-yield wafer chuck; infrared lamp heating; membrane fabrication; reduced volume; siloxane-based sealing rings; single-sided wet etching; Biomembranes; Fabrication; Infrared heating; Laboratories; Micromechanical devices; Seals; Structural rings; Temperature; Thermal stresses; Wet etching;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid State Sensors and Actuators, 1997. TRANSDUCERS '97 Chicago., 1997 International Conference on
Conference_Location
Chicago, IL
Print_ISBN
0-7803-3829-4
Type
conf
DOI
10.1109/SENSOR.1997.613751
Filename
613751
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