• DocumentCode
    314205
  • Title

    High-yield wafer chuck for single-sided wet etching of MEMS structures

  • Author

    Brugger, J. ; Beljakovic, G. ; Despont, M. ; Biebuyck, H. ; de Rooij, N.F. ; Vettiger, P.

  • Author_Institution
    Zurich Res. Lab., IBM Res. Div., Switzerland
  • Volume
    1
  • fYear
    1997
  • fDate
    16-19 Jun 1997
  • Firstpage
    711
  • Abstract
    We describe a new O-ring setup for wet etching processes. The low-cost approach using siloxane-based sealing rings has been successful for the single-sided etching of silicon and silicon dioxide using a reduced volume of KOH and BHF, respectively. With this approach, the previously fabricated device elements on the reverse wafer side are not damaged. The etchant was heated by an infrared lamp. The achieved etch control allowed the fabrication of membranes only 5 μm thick with good accuracy using an etch stop layer
  • Keywords
    circuit optimisation; etching; integrated circuit yield; membranes; micromechanical devices; process control; seals (stoppers); 5 mum; BHF; HF; KOH; MEMS structures; O-ring setup; Si; SiO2; buffered hydrofluoric acid; etch control; etch stop layer; high-yield wafer chuck; infrared lamp heating; membrane fabrication; reduced volume; siloxane-based sealing rings; single-sided wet etching; Biomembranes; Fabrication; Infrared heating; Laboratories; Micromechanical devices; Seals; Structural rings; Temperature; Thermal stresses; Wet etching;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid State Sensors and Actuators, 1997. TRANSDUCERS '97 Chicago., 1997 International Conference on
  • Conference_Location
    Chicago, IL
  • Print_ISBN
    0-7803-3829-4
  • Type

    conf

  • DOI
    10.1109/SENSOR.1997.613751
  • Filename
    613751