Title :
Impact of RF circuit imperfections on multi-carrier and single-carrier based transmissions at 60 GHz
Author :
Rizvi, Umar H. ; Janssen, Gerard J M ; Weber, Jos H.
Author_Institution :
Delft Univ. of Technol., Delft
Abstract :
Circuit technology for 60 GHz is still limited, and impairments due to radio frequency (RF) circuit imperfections must be taken into account. Therefore, the candidate transmission schemes, in addition to multi-path fading, should be fairly resistant to RF circuit imperfections. In this paper, a performance comparison of multi-carrier (MC) and single-carrier (SC) based transmission schemes in the presence of DAC/ADC imperfections and amplifier nonlinearities, is carried out. It is shown that the SC scheme has substantially lower front-end requirements than its MC counterpart, while having the same overall system complexity.
Keywords :
analogue-digital conversion; digital-analogue conversion; fading channels; millimetre wave amplifiers; multipath channels; DAC-ADC imperfections; RF circuit imperfections; amplifier nonlinearities; candidate transmission schemes; frequency 60 GHz; multi-path fading; multicarrier based transmissions; radio frequency circuit; single-carrier based transmissions; Bit error rate; CMOS technology; Circuits; Degradation; Delay; Fading; OFDM; Radio frequency; Semiconductor device modeling; Transceivers; ADC; DAC; OFDM; SC-FDE; amplifier nonlinearities;
Conference_Titel :
Radio and Wireless Symposium, 2008 IEEE
Conference_Location :
Orlando, FL
Print_ISBN :
978-1-4244-1462-8
Electronic_ISBN :
978-1-4244-1463-5
DOI :
10.1109/RWS.2008.4463586
