Title :
Investigations of the diagnosibility of digital networks with BIST
Author :
Ubar, Raimund ; Kostin, Sergei ; Raik, Jaan
Author_Institution :
Dept. of Comput. Eng., TTU, Tallinn
Abstract :
The problem of embedded fault diagnosis in digital systems based on Built-In Self-Test (BIST) facilities is discussed. A conception for diagnosis of digital circuits, which does not use fault models, and methods for calculating the diagnosibility of the given circuit are presented. The proposed measures of diagnosibility can be used for redesign of the circuit to improve the exactness of locating the faults or faulty regions in digital circuits. Experimental results provide the data which characterize the diagnosibility of circuits for the ISCAS benchmark family.
Keywords :
built-in self test; digital integrated circuits; fault diagnosis; integrated circuit testing; maintenance engineering; built-in self-test; diagnosibility; digital circuits diagnosis; digital networks; embedded fault diagnosis; Algorithm design and analysis; Built-in self-test; Circuit faults; Dictionaries; Digital circuits; Digital systems; Failure analysis; Fault diagnosis; Integrated circuit yield; Manufacturing; BIST; diagnosibility; digital networks; fault diagnosis;
Conference_Titel :
Test Workshop, 2009. LATW '09. 10th Latin American
Conference_Location :
Buzios, Rio de Janeiro
Print_ISBN :
978-1-4244-4207-2
Electronic_ISBN :
978-1-4244-4206-5
DOI :
10.1109/LATW.2009.4813806
