Title :
BugTracer: A system for integrated circuit development tracking and statistics retrieval
Author :
Cardoso, Thiago Nunes Coelho ; Nacif, José Augusto ; Fernandes, Antônio Otávio ; Coelho, Claudionor Nunes, Jr.
Author_Institution :
Comput. Sci. Dept., Univ. Fed. de Minas Gerais, Belo Horizonte
Abstract :
Verification is one of the most critical stages in integrated circuit development. Given the current market conditions, a wise manner to improve verification results would be concentrating resources in error-prone modules. In this paper a novel method of attaching information to commit messages is introduced. Through the use of a simple and parseable language, important and more accurate statistics can be retrieved. Tools were developed in order to make commits faster and prevent erroneous data analysis.
Keywords :
electronic engineering computing; integrated circuit design; error-prone modules; integrated circuit design; integrated circuit development tracking; parseable language; statistics retrieval; Computer errors; Computer science; Data analysis; Data mining; Databases; File servers; Information retrieval; Joining processes; Resource management; Statistics;
Conference_Titel :
Test Workshop, 2009. LATW '09. 10th Latin American
Conference_Location :
Buzios, Rio de Janeiro
Print_ISBN :
978-1-4244-4207-2
Electronic_ISBN :
978-1-4244-4206-5
DOI :
10.1109/LATW.2009.4813810
