Title :
Structured Trace Diagnosis for LSSD Board Testing -- An Alternative to Full Fault Simulated Diagnosis
Author :
Hsu, F. ; Solecky, P. ; Beaudoin, R.
Author_Institution :
IBM Corporation System Products Division, Endicott, NY
Abstract :
This paper reviews the structured design concept and conventional diagnostic methods. It presents an alternate approach, called structured-trace method, for diagnosing failures on high level packages, which are structurally designed, such as LSSD structure. Implications of structured designs on failure diagnosis are discussed. Results from an evaluation study of the method are presented.
Keywords :
Automatic testing; Circuit faults; Circuit simulation; Circuit testing; Costs; Fault diagnosis; Logic gates; Logic testing; Packaging; System testing;
Conference_Titel :
Design Automation, 1981. 18th Conference on
DOI :
10.1109/DAC.1981.1585459