• DocumentCode
    3144074
  • Title

    Instabilities in oxide semiconductor transparent thin film transistors

  • Author

    Conley, J.F., Jr.

  • Author_Institution
    Sch. of Electr. Eng. & Comput. Sci., Oregon State Univ., Corvallis, OR, USA
  • fYear
    2009
  • fDate
    18-22 Oct. 2009
  • Firstpage
    50
  • Lastpage
    55
  • Abstract
    New amorphous oxide semiconductor transparent thin film transistors (TTFTs) exhibit good mobility (5 to >50 cm2/V-sec), are transparent, and can be processed at low temperatures. They show great promise for high performance large area electronics applications such as flexible electronics, transparent electronics, and analog current drivers for OLED displays. An overview of TFT operation, expected reliability concerns, and an up to date review of recently emerging work on the stability of these devices will be presented.
  • Keywords
    amorphous semiconductors; flexible electronics; reviews; semiconductor device reliability; semiconductor thin films; thin film transistors; transparency; OLED displays; TTFT device stability; amorphous oxide semiconductor transparent thin film transistor; analog current drivers; flexible electronics; large area electronics; mobility; reliability; review; transparent electronics; Active matrix liquid crystal displays; Amorphous materials; Bonding; Crystalline materials; Crystallization; Flat panel displays; Grain boundaries; Semiconductor materials; Stability; Thin film transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Integrated Reliability Workshop Final Report, 2009. IRW '09. IEEE International
  • Conference_Location
    S. Lake Tahoe, CA
  • ISSN
    1930-8841
  • Print_ISBN
    978-1-4244-3921-8
  • Electronic_ISBN
    1930-8841
  • Type

    conf

  • DOI
    10.1109/IRWS.2009.5383033
  • Filename
    5383033