• DocumentCode
    3145103
  • Title

    Logic Simulation for LSI

  • Author

    Hirakawa, Kazuyuki ; Shiraki, Noboru ; Muraoka, Michiaki

  • Author_Institution
    OKI Electric Industry Co., Ltd., Tokyo, Japan
  • fYear
    1982
  • fDate
    14-16 June 1982
  • Firstpage
    755
  • Lastpage
    761
  • Abstract
    This paper describes the logic simulation system and the design verification method for logic design, timing analysis, and testing for VLSI. The integrity of test and network data on a logic design stage must be kept in LSI testing in the final verification stage. In dealing with consistency, emphasis is placed on the discrepancy between the real time domain on a simulator and a testing time domain on an LSI tester. The logic simulation system (Block INtegrator and AnaLYzer: BINALY) handles a hierarchical structure, a detailed timing model, and a timing alignment method for a testing time domain.
  • Keywords
    Analytical models; Circuit simulation; Circuit testing; Large scale integration; Logic design; Logic devices; Logic testing; System testing; Timing; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation, 1982. 19th Conference on
  • Conference_Location
    Las Vegas, NV, USA
  • ISSN
    0146-7123
  • Print_ISBN
    0-89791-020-6
  • Type

    conf

  • DOI
    10.1109/DAC.1982.1585580
  • Filename
    1585580