DocumentCode
3145103
Title
Logic Simulation for LSI
Author
Hirakawa, Kazuyuki ; Shiraki, Noboru ; Muraoka, Michiaki
Author_Institution
OKI Electric Industry Co., Ltd., Tokyo, Japan
fYear
1982
fDate
14-16 June 1982
Firstpage
755
Lastpage
761
Abstract
This paper describes the logic simulation system and the design verification method for logic design, timing analysis, and testing for VLSI. The integrity of test and network data on a logic design stage must be kept in LSI testing in the final verification stage. In dealing with consistency, emphasis is placed on the discrepancy between the real time domain on a simulator and a testing time domain on an LSI tester. The logic simulation system (Block INtegrator and AnaLYzer: BINALY) handles a hierarchical structure, a detailed timing model, and a timing alignment method for a testing time domain.
Keywords
Analytical models; Circuit simulation; Circuit testing; Large scale integration; Logic design; Logic devices; Logic testing; System testing; Timing; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation, 1982. 19th Conference on
Conference_Location
Las Vegas, NV, USA
ISSN
0146-7123
Print_ISBN
0-89791-020-6
Type
conf
DOI
10.1109/DAC.1982.1585580
Filename
1585580
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