• DocumentCode
    3145567
  • Title

    Risky Module Estimation in Safety-Critical Software

  • Author

    Kim, Young-Mi ; Jeong, Choong-Heui ; Jeong, A-Rang ; Kim, Hyeon Soo

  • Author_Institution
    Korea Inst. of Nucl. Safety, Daejeon, South Korea
  • fYear
    2009
  • fDate
    1-3 June 2009
  • Firstpage
    967
  • Lastpage
    970
  • Abstract
    Software used in safety-critical system must have high dependability. Software testing and V&V (Verification and Validation) activities are very important for assuring high software quality. If we can predict the risky modules in safety-critical software, testing activities and regulation activities can be applied to them more intensively. In this paper, we classify the estimated risk classes which can be used for deep testing and V&V. We predict the risk class for each module using support vector machines. We can consider that the modules classified to risk class 5 or 4 are more risky than others relatively. For all classification error rates, we expect that the results can be useful and practical for software testing, V&V, and activities for regulatory reviews. In the future works, to improve the practicality, we will have to investigate other machine learning algorithms and datasets.
  • Keywords
    learning (artificial intelligence); program testing; safety-critical software; software quality; support vector machines; classification error rates; machine learning algorithms; regulation activities; risky module estimation; safety-critical software; safety-critical system; software quality; software testing; support vector machines; testing activities; Classification tree analysis; Kernel; Machine learning; Software metrics; Software quality; Software safety; Software testing; Space technology; Support vector machine classification; Support vector machines; SVM; Safety-Critical Software; Software Testing; Software V&V;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer and Information Science, 2009. ICIS 2009. Eighth IEEE/ACIS International Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    978-0-7695-3641-5
  • Type

    conf

  • DOI
    10.1109/ICIS.2009.83
  • Filename
    5223201