DocumentCode
3145568
Title
A ring-VCO-based injection-locked frequency multiplier using a new pulse generation technique in 65 nm CMOS
Author
Kanemaru, Norifumi ; Ikeda, Sho ; Kamimura, Tatsuya ; Sang-yeop Lee ; Tanoi, Satoru ; Ito, Hiroyuki ; Ishihara, Noboru ; Masu, Kazuya
Author_Institution
Solutions Res. Lab., Tokyo Inst. of Technol., Yokohama, Japan
fYear
2011
fDate
17-18 Nov. 2011
Firstpage
32
Lastpage
35
Abstract
This paper proposes a low-phase-noise ring-VCO-based frequency multiplier with a new subharmonic direct injection locking technique that only uses a time-delay cell and four MOS transistors. Since the proposed technique behaves as an exclusive OR and can double the reference signal frequency, it increases phase correction points and achieves low phase noise characteristic across the wide output frequency range. The frequency multiplier was fabricated by using 65 nm Si CMOS process. Measured 1-MHz-offset phase noise at 6.34 GHz with reference signals of 528 MHz was -113dBc/Hz.
Keywords
CMOS integrated circuits; MOSFET; frequency multipliers; injection locked oscillators; pulse generators; voltage-controlled oscillators; CMOS; MOS transistors; frequency 528 MHz; frequency 6.34 GHz; low phase noise ring VCO-based frequency multiplier; phase correction points; pulse generation technique; reference signal frequency; ring-VCO-based injection-locked frequency multiplier; size 65 nm; subharmonic direct injection locking; time-delay cell; CMOS; Injection locked frequency multiplier; pulse injection; ring VCO;
fLanguage
English
Publisher
ieee
Conference_Titel
SoC Design Conference (ISOCC), 2011 International
Conference_Location
Jeju
Print_ISBN
978-1-4577-0709-4
Electronic_ISBN
978-1-4577-0710-0
Type
conf
DOI
10.1109/ISOCC.2011.6138639
Filename
6138639
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