Title :
A range-scaled 13b 100MS/s 0.13μm CMOS SHA-free ADC based on a single reference
Author :
Hwang, Dong-Hyun ; Song, Jung-Eun ; Nam, Sang-Pil ; Kim, Hyo-Jin ; An, Tai-Ji ; Kim, Kwang-Soo ; Lee, Seung-Hoon
Author_Institution :
Dept. of Electron. Eng., Sogang Univ., Seoul, South Korea
Abstract :
This work describes a 13b 100MS/s 0.13μm CMOS four-step pipeline ADC. The proposed SHA-free ADC employs a range-scaling technique based on switched-capacitor circuits properly to handle input signals twice as wide as a single on-chip reference range in the first pipeline stage. The range scaling makes reference driving buffers keep a sufficient dynamic voltage headroom and doubles the offset tolerance of a latched comparator without a pre-amp in the flash ADC1. The prototype ADC demonstrates the measured DNL and INL within 0.57LSB and 0.99LSB, respectively. The ADC shows a maximum SNDR of 64.6dB and a SFDR of 74.0dB at 100MS/s, respectively. The ADC with an active die area of 1.2mm2 consumes 145.6mW including the high-speed reference buffers and 91mW excluding the buffers at 100MS/s and a 1.3V supply voltage.
Keywords :
CMOS integrated circuits; analogue-digital conversion; CMOS four-step pipeline ADC; SHA-free analog-to-digital converter; dynamic voltage headroom; flash ADC1; latched comparator; offset tolerance; power 145.6 mW; power 91 mW; range-scaling technique; reference driving buffers; single on-chip reference range; size 0.13 mum; switched-capacitor circuits; voltage 1.3 V; Analog-to-digital converter (ADC); SHA-free; high resolution; pipeline; range scaling; two-step reference selection;
Conference_Titel :
SoC Design Conference (ISOCC), 2011 International
Conference_Location :
Jeju
Print_ISBN :
978-1-4577-0709-4
Electronic_ISBN :
978-1-4577-0710-0
DOI :
10.1109/ISOCC.2011.6138646