Title :
64th ARFTG Microwave Measurements Conference (IEEE Cat. No.04EX1005)
Abstract :
The following topics are dealt with: uncertainty; digital communications system metrics; semiconductor modeling; differential measurements; microwave measurement technique; and on-wafer technique.
Keywords :
differential amplifiers; digital communication; measurement uncertainty; microwave measurement; semiconductor device models; wafer-scale integration; differential measurements; digital communications system metrics; microwave measurement technique; on-wafer technique; semiconductor modeling; uncertainty;
Conference_Titel :
Microwave Measurements Conference, Fall 2004. 64th ARFTG
Conference_Location :
Orlando, FL, USA
Print_ISBN :
0-7803-8952-2
DOI :
10.1109/ARFTGF.2004.1427558
