DocumentCode
3147312
Title
Experimental analysis of short-circuit line technique for measuring permeability of ferromagnetic materials
Author
Bregar, V.B. ; Lisjak, D. ; Nidarsic, A. ; Drofenik, M.
Author_Institution
Kolektor Group Feriti, Ljubljana, Slovenia
fYear
2004
fDate
2-3 Dec. 2004
Firstpage
117
Lastpage
123
Abstract
Measurement of S-parameters in order to determine permeability and permittivity of materials is a well-established method, which has already been analyzed in great detail. However, the focus of the analysis has been the permittivity of dielectric materials. We have analyzed experimentally the short-circuit line technique for the determination of the permeability of ferrimagnetic materials, especially in the vicinity of ferromagnetic resonance where the material has high magnetic losses. We analyzed the fact that, by using samples with different lengths, we obtained different values for permeability and evaluated the difference as a function of sample length. Further, we compared the results obtained by single-sample and two-sample techniques and evaluated the influence of the distance between the sample and short circuit. The results were compared with the uncertainties due to measurement errors (sample length, sample position, reference plane position). We have analyzed sintered ferrite materials and also compared the inevitable variability of the samples´ permeability characteristics.
Keywords
ferrites; ferromagnetic materials; ferromagnetic resonance; magnetic permeability; magnetic permeability measurement; measurement errors; S-parameter measurement; ferrimagnetic materials; ferromagnetic material permeability measurement; ferromagnetic resonance; magnetic losses; measurement errors; reference plane position; sample length; sample position; short-circuit line technique; sintered ferrite materials; Dielectric materials; Dielectric measurements; Ferrimagnetic materials; Magnetic analysis; Magnetic losses; Magnetic materials; Magnetic resonance; Permeability measurement; Permittivity measurement; Scattering parameters;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Measurements Conference, Fall 2004. 64th ARFTG
Print_ISBN
0-7803-8952-2
Type
conf
DOI
10.1109/ARFTGF.2004.1427581
Filename
1427581
Link To Document