DocumentCode :
3147849
Title :
Influence of the magnetron operating frequency on the results of microwave heating
Author :
Soltysiak, Michal ; Erle, U. ; Celuch, Malgorzata
Author_Institution :
QWED Sp. z o.o., Warsaw, Poland
fYear :
2010
fDate :
23-28 May 2010
Firstpage :
1436
Lastpage :
1439
Abstract :
In typical simulations of heating processes in household microwave ovens it is assumed that the frequency of the magnetron stays constant at its nominal value. In reality, due to manufacturing variations, load parameters, and the magnetron temperature, frequency differences or jumps of 50 MHz may occur. This publication shows coupled electromagnetic and thermal simulations of microwave heating phenomena in household microwave ovens. Several analyses are performed for a static load at various frequencies in order to assess possible effects of frequency changes on the heating patterns. A novel FDTD regime with moving loads and frequency tuning is then applied to demonstrate that the load rotation typically implemented in domestic microwave ovens largely equalizes the patterns at different frequencies. Both, the total absorbed power and the power distribution in the load are studied.
Keywords :
domestic appliances; finite difference time-domain analysis; magnetrons; microwave ovens; thermal analysis; FDTD regime; domestic microwave oven; electromagnetic simulation; frequency 50 MHz; frequency difference; frequency jumps; frequency tuning; heating pattern; heating process; household microwave oven; load parameter; load rotation; magnetron operating frequency; magnetron temperature; manufacturing variation; microwave heating; static load; thermal simulations; Electromagnetic coupling; Electromagnetic heating; Finite difference methods; Frequency; Magnetic analysis; Manufacturing; Microwave ovens; Pattern analysis; Performance analysis; Temperature; electromagnetic simulations; magnetron frequency; microwave oven; thermal simulations;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest (MTT), 2010 IEEE MTT-S International
Conference_Location :
Anaheim, CA
ISSN :
0149-645X
Print_ISBN :
978-1-4244-6056-4
Electronic_ISBN :
0149-645X
Type :
conf
DOI :
10.1109/MWSYM.2010.5517828
Filename :
5517828
Link To Document :
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