DocumentCode :
3147955
Title :
A bivariate attribute measurement model for six sigma project
Author :
Lyu, JrJung ; Chen, MingNan
Author_Institution :
Dept. of Ind. & Inf. Manage., Nat. Cheng Kung Univ., Tainan
fYear :
2008
fDate :
21-24 Sept. 2008
Firstpage :
1129
Lastpage :
1134
Abstract :
Many quality improvement programs employ measurement system analysis (MSA) to ensure the reliability of measurement results in measure phase, which are the basis for decisions regarding the behavior of critical quality characteristics. Gauge repeatability and reproducibility (R&R) study is an important approach for evaluating the precision of MSA. Although many gauge capability studies exist and are common in industry, few have discussed cases with attribute data, especially on the case related to two or more related quality characteristics simultaneously. This study presents a novel model for evaluating gauge R&R for bivariate attribute data. An example is utilized to illustrate the application process of the proposed model. The proposed model is illustrated to be capable to assess and to improve measurement systems with bivariate attribute data.
Keywords :
continuous improvement; inspection; measurement systems; project management; six sigma (quality); bivariate attribute measurement model; continuous improvement methodology; gauge repeatability-reproducibility study; inspection; measurement system analysis; quality improvement programs; six sigma project; Information analysis; Information management; Particle measurements; Phase measurement; Power system modeling; Process control; Reproducibility of results; Six sigma; Thin film transistors; Time measurement; attribute data; repeatability; reproducibility;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Management of Innovation and Technology, 2008. ICMIT 2008. 4th IEEE International Conference on
Conference_Location :
Bangkok
Print_ISBN :
978-1-4244-2329-3
Electronic_ISBN :
978-1-4244-2330-9
Type :
conf
DOI :
10.1109/ICMIT.2008.4654528
Filename :
4654528
Link To Document :
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