Title :
Equipment to study the gamma total dose effects on components of microcomputing systems
Author :
Joffre, F. ; Buisson, J. ; Mijuin, D. ; Brunet, J.P. ; Marceau, M. ; Perrault, M.
Author_Institution :
Centre d´´Etude de Saclay CEA/DTA/LETI/DEIN/SIR, Gif-sur-Yvette, France
Abstract :
Robotics in hostile environment are affected by the effects of the total gamma dose on microcomputing electronic components. A dose of 1000 grays is expected particularly for the CMOS technology. A test equipment adapted to these components is developed in order to investigate their irradiation hardness assurance. Test after irradiation, test on line and nominal running test on line methods are described. Different results obtained for numerous components are presented to compare the methods and to determine which components have reached the objective
Keywords :
CMOS integrated circuits; gamma-ray effects; integrated circuit testing; microprocessor chips; radiation hardening (electronics); test equipment; 1000 grays; CMOS; gamma total dose effects; hostile environment; irradiation hardness assurance; microcomputing systems; mobile robots; nominal running test on line; test after irradiation; test equipment; test on line; CMOS technology; Circuit testing; Cows; Distributed control; Electronic components; Instruments; Resumes; Robots; Telephony; Test equipment;
Conference_Titel :
Radiation and its Effects on Devices and Systems, 1991. RADECS 91., First European Conference on
Conference_Location :
La Grande-Motte
Print_ISBN :
0-7803-0208-7
DOI :
10.1109/RADECS.1991.213536
