• DocumentCode
    3148131
  • Title

    Influence of environmental parameters and testing process during microprocessor experiments with low irradiation dose rates

  • Author

    Laviron, A. ; Gerard, G. ; Gauthier, G. ; Henry, J.Y. ; Meur, M. Le

  • Author_Institution
    IPSN, Centre d´´etudes de Valduc, CEA, Is-sur-Tille, France
  • fYear
    1991
  • fDate
    9-12 Sep 1991
  • Firstpage
    529
  • Lastpage
    533
  • Abstract
    Within the framework of nuclear safety studies, an experimental program has been initiated some years ago in order to determine the most important parameters to take into account for experiments on microprocessors placed in a low dose rate nuclear irradiation environment. The authors, after briefly describing the preceding published results, present the most recent results obtained especially about the effects of the temperature, the origin of the batches, the angle of the incident irradiation, the used testing device
  • Keywords
    integrated circuit testing; microprocessor chips; radiation effects; radiation hardening (electronics); environmental parameters; low irradiation dose rates; microprocessor experiments; nuclear irradiation environment; testing process; Circuit testing; Cobalt; Degradation; Microprocessors; Resumes; Safety; System testing; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation and its Effects on Devices and Systems, 1991. RADECS 91., First European Conference on
  • Conference_Location
    La Grande-Motte
  • Print_ISBN
    0-7803-0208-7
  • Type

    conf

  • DOI
    10.1109/RADECS.1991.213544
  • Filename
    213544