DocumentCode
3148131
Title
Influence of environmental parameters and testing process during microprocessor experiments with low irradiation dose rates
Author
Laviron, A. ; Gerard, G. ; Gauthier, G. ; Henry, J.Y. ; Meur, M. Le
Author_Institution
IPSN, Centre d´´etudes de Valduc, CEA, Is-sur-Tille, France
fYear
1991
fDate
9-12 Sep 1991
Firstpage
529
Lastpage
533
Abstract
Within the framework of nuclear safety studies, an experimental program has been initiated some years ago in order to determine the most important parameters to take into account for experiments on microprocessors placed in a low dose rate nuclear irradiation environment. The authors, after briefly describing the preceding published results, present the most recent results obtained especially about the effects of the temperature, the origin of the batches, the angle of the incident irradiation, the used testing device
Keywords
integrated circuit testing; microprocessor chips; radiation effects; radiation hardening (electronics); environmental parameters; low irradiation dose rates; microprocessor experiments; nuclear irradiation environment; testing process; Circuit testing; Cobalt; Degradation; Microprocessors; Resumes; Safety; System testing; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation and its Effects on Devices and Systems, 1991. RADECS 91., First European Conference on
Conference_Location
La Grande-Motte
Print_ISBN
0-7803-0208-7
Type
conf
DOI
10.1109/RADECS.1991.213544
Filename
213544
Link To Document