DocumentCode :
3148299
Title :
Subspace based active contours with a joint distribution metric for semi-supervised natural image segmentation
Author :
Peng, Shu-Juan ; Liu, Xin ; Cheung, Yiu-Ming
Author_Institution :
Dept. of Comput. Sci. & Technol., Huaqiao Univ., Xiamen, China
fYear :
2012
fDate :
25-30 March 2012
Firstpage :
1173
Lastpage :
1176
Abstract :
In this paper, we present an efficient active contour with a joint distribution metric for semi-supervised natural image segmentation. Firstly, we project an RGB image into two-dimensional subspace and draw a polygon curve around the Region of Interest (ROI) as the initial evolving curve. Then, we model the regional statistics in terms of joint probability distributions and propose an effective distribution metric to regularize the active contours for evolution. Subsequently, we convert the resultant zero level set function into binary pattern and find all the 8-connected regions. Finally, the largest region is selected as the desired ROI and smoothed with a circular averaging filter so that the corresponding final segmentation result can be obtained. Meanwhile, the proposed approach also features fast convergence and easy implementation in comparison with the traditional methods, which need a laborious process of re-initializing the zero level set in terms of a sign distance function (SDF) periodically. The experiments show the promising results.
Keywords :
image segmentation; statistics; 8-connected regions; RGB image; ROI; SDF; circular averaging filter; joint probability distribution metric; polygon curve; regional statistics; semisupervised natural image segmentation; sign distance function; subspace based active contours; two-dimensional subspace; Abstracts; Image edge detection; Image segmentation; Optical imaging; Principal component analysis; Subspace; active contours; joint distribution metric; natural image segmentation; semi-supervised;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Acoustics, Speech and Signal Processing (ICASSP), 2012 IEEE International Conference on
Conference_Location :
Kyoto
ISSN :
1520-6149
Print_ISBN :
978-1-4673-0045-2
Electronic_ISBN :
1520-6149
Type :
conf
DOI :
10.1109/ICASSP.2012.6288096
Filename :
6288096
Link To Document :
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