• DocumentCode
    3148337
  • Title

    Anti-biased RF MEMS varactor topology for 20–25 dB linearity enhancement

  • Author

    Chen, Kenle ; Kovacs, Andrew ; Peroulis, Dimitrios

  • Author_Institution
    Birck Nanotechnol. Center, Purdue Univ., West Lafayette, IN, USA
  • fYear
    2010
  • fDate
    23-28 May 2010
  • Firstpage
    1142
  • Lastpage
    1145
  • Abstract
    A new topology for significantly improving the linearity of RF MEMS varactors is reported in this paper. A single MEMS varactor subject to a low frequency noise and/or modulating signal is the main structure under consideration. The key idea is to separate the single varactor into two varactors in parallel, which are anti-biased. This leads to out-of-phase vibration of the two beams under the influence of the low-frequency noise and/or modulating signal, which eventually leads to a nearly constant capacitance value of the entire topology. The effectiveness of the new method is demonstrated by both measured results from fabricated RF MEMS varactors and simulated results using a large-signal model of MEMS varactor in Agilent´s Advanced Design System (ADS). Both experimental and simulated results indicate an improvement of 20-25 dB compared to the conventional design when the varactors are biased close to their pull-in voltage and the low-frequency signal is close to their self-resonant frequency. This underlines the potential of the proposed topology in high-power RF MEMS circuits.
  • Keywords
    micromechanical devices; varactors; vibrations; Agilent´s advanced design system; anti-biased RF MEMS varactor topology; beams; linearity enhancement; low frequency noise; modulating signal; out-of-phase vibration; Capacitance; Circuit simulation; Linearity; Low-frequency noise; Micromechanical devices; Optical modulation; Radiofrequency microelectromechanical systems; Signal design; Topology; Varactors; Intermodulation; Linearity; RF MEMS varactor; Vibration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest (MTT), 2010 IEEE MTT-S International
  • Conference_Location
    Anaheim, CA
  • ISSN
    0149-645X
  • Print_ISBN
    978-1-4244-6056-4
  • Electronic_ISBN
    0149-645X
  • Type

    conf

  • DOI
    10.1109/MWSYM.2010.5517852
  • Filename
    5517852