• DocumentCode
    3148340
  • Title

    Integrating path testing with software reliability estimation using control flow graph

  • Author

    Hsu, Chao-Jung ; Huang, Chin-Yu

  • Author_Institution
    Dept. of Comput. Sci., Nat. Tsing Hua Univ., Hsinchu
  • fYear
    2008
  • fDate
    21-24 Sept. 2008
  • Firstpage
    1234
  • Lastpage
    1239
  • Abstract
    In this paper, we propose a new approach to calculate a pathpsilas reliability along three basic programming structures, which include sequential, branching, and looping structures. The pathpsilas reliability is then taken to approximate the systempsilas reliability, and an example is evaluated to validate and show the effectiveness of proposed method. The numerical example yields several findings. First, the proposed method can be effectively used in the early stages of testing. Second, the path reliability is highly relative to system reliability, and the estimated error of the proposed method is acceptable. Third, with higher test coverage on path testing, the accuracy of system reliability estimation can be further improved. Therefore, the proposed method is a viable alternative method for architecture-based software reliability modeling.
  • Keywords
    data flow graphs; program testing; software architecture; software reliability; architecture-based software reliability modeling; branching structures; control flow graph; looping structures; path testing; sequential structures; software reliability estimation; Application software; Chaos; Flow graphs; Mathematical model; Programming; Sequential analysis; Software quality; Software reliability; Software testing; System testing; Architecture-based software reliability model; Control flow graph; Markov chain; Path testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Management of Innovation and Technology, 2008. ICMIT 2008. 4th IEEE International Conference on
  • Conference_Location
    Bangkok
  • Print_ISBN
    978-1-4244-2329-3
  • Electronic_ISBN
    978-1-4244-2330-9
  • Type

    conf

  • DOI
    10.1109/ICMIT.2008.4654546
  • Filename
    4654546