DocumentCode
3148947
Title
Workshop on fault diagnosis and tolerance in cryptography
Author
Breveglieri, Luca ; Koren, Israel
Author_Institution
University of Massachusetts
fYear
2004
fDate
June 28 2004-July 1 2004
Firstpage
840
Lastpage
840
Abstract
Cryptographic devices are becoming increasingly ubiquitous and complex, making reliability an important design objective. Moreover, the diffusion of mobile, low-price consumer electronic equipment containing cryptographic components makes them more vulnerable to attack procedures, in particular to those based on injection of faults. This workshop aims at providing researchers in both the dependability and cryptography communities an opportunity to start bridging the gap between fault diagnosis and tolerance techniques, and cryptography.
Keywords
Communities; Conferences; Elliptic curve cryptography; Fault diagnosis; Reliability theory;
fLanguage
English
Publisher
ieee
Conference_Titel
Dependable Systems and Networks, 2004 International Conference on
Conference_Location
Florence, Italy
Print_ISBN
0-7695-2052-9
Type
conf
DOI
10.1109/DSN.2004.1311963
Filename
1311963
Link To Document