DocumentCode
3152127
Title
Effects of selective wet etching on the spectral properties of a vertical-cavity surface-emitting laser/detector
Author
Bringer, C. ; Bardinal, V. ; Camps, T. ; Dubreuil, P. ; Fontaine, C.
Author_Institution
Lab. d´´Autom. et d´´Anal. des Syst., CNRS, Toulouse, France
fYear
2003
fDate
22-27 June 2003
Firstpage
133
Abstract
In this paper, we present results on modelling, fabrication and characterization of oxide-confined VCSELs for short-distance alternative emission and photodetection at 820 nm. In the present designed single-cavity GaAs-based device, the buried oxide layer is not only used to obtain a single mode laser beam but also to enable decoupling between a small surface emission, limited by the aperture and a large surface detection, limited by the internal diameter of the top electrodes. The selective wet etching was found to improve simultaneously the detection sensitivity and the differential quantum efficiency without damaging the active surface.
Keywords
III-V semiconductors; buried layers; etching; gallium arsenide; infrared spectra; laser cavity resonators; laser modes; optical fabrication; photodetectors; surface emitting lasers; 820 nm; GaAs; buried oxide layer; detection sensitivity; differential quantum efficiency; oxide-confined VCSEL; selective wet etching; short-distance emission; short-distance photodetection; single mode laser beam; single-cavity GaAs device; spectral property; vertical-cavity surface-emitting detector; vertical-cavity surface-emitting laser; Electronic mail; Laser beams; Laser modes; Mirrors; Optical surface waves; Optoelectronic devices; Resonance; Surface emitting lasers; Vertical cavity surface emitting lasers; Wet etching;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics Europe, 2003. CLEO/Europe. 2003 Conference on
Print_ISBN
0-7803-7734-6
Type
conf
DOI
10.1109/CLEOE.2003.1312194
Filename
1312194
Link To Document