Title :
S-Parameter-Based Modal Decomposition of Multiconductor Transmission Lines and Its Application to De-Embedding
Author :
Amakawa, S. ; Yamanaga, K. ; Ito, H. ; Sato, T. ; Ishihara, N. ; Masu, K.
Author_Institution :
Tokyo Inst. of Technol., Tokyo
fDate :
March 30 2009-April 2 2009
Abstract :
Theory and experiments are presented of modal decomposition of scattering matrices of multiconductor transmission lines (TLs). In effect, n coupled TLs are decomposed into n independent ones. Its use is demonstrated by applying it to thru-only de-embedding of 4 coupled TLs (synthesized data) and 2 coupled TLs (measurement data from a 0.18 mum-CMOS chip). The proposed de-embedding method could greatly facilitate accurate characterization of on-chip multiport networks.
Keywords :
S-matrix theory; S-parameters; coupled transmission lines; modal analysis; multiconductor transmission lines; multiport networks; transmission line matrix methods; S-parameter-based modal decomposition; coupled TL; deembedding method; multiconductor transmission lines; on-chip multiport network; scattering matrices; Couplings; Data mining; Frequency conversion; Laboratories; Multiconductor transmission lines; Performance evaluation; Scattering; Symmetric matrices; Transmission line matrix methods; Transmission line measurements;
Conference_Titel :
Microelectronic Test Structures, 2009. ICMTS 2009. IEEE International Conference on
Conference_Location :
Oxnard, CA
Print_ISBN :
978-1-4244-4259-1
DOI :
10.1109/ICMTS.2009.4814635