DocumentCode :
3153509
Title :
FDTD Modeling Applications in Ultrahigh-Speed Interconnects and Electromagnetic Compatibility of Complex Packages
Author :
Simpson, Jamesina J.
Author_Institution :
Electr. & Comput. Eng. Dept., Univ. of New Mexico, Albuquerque, NM
fYear :
2009
fDate :
19-20 Feb. 2009
Firstpage :
13
Lastpage :
16
Abstract :
This manuscript presents details of finite-difference time-domain (FDTD) modeling for applications at Intel Corporation in ultrahigh-speed interconnects and electromagnetic compatibility of complex packages. First, an experimental and computational study of substrate integrated waveguides (SIWs) optimized for use as ultrahigh-speed bandpass waveguiding digital interconnects is reported. The novelty of the present work resides in the successful design, fabrication, and testing of low-loss SIWs that achieve 100% relative bandwidths. These SIWs could in principle using standard circuit board technology provide bandpass operation at center frequencies approaching 200 GHz and data rates of 200 Gb/sec. These data rates meet or exceed those expected eventually for proposed silicon photonic technologies. The second FDTD modeling application involves characterizing and solving electromagnetic compatibility problems arising in ultracompact portable electronic devices, such as cellphones operating with mixes of high-speed digital and microwave signals. For this work, an ultra high-resolution full-vector 3D FDTD model of a complete compact portable electronic device is desired. In pursuit of this goal, a sample integrated circuit package is first modeled using 343 million grid cells. As future work, additional components within a sample portable electronic device will be modeled, including the circuit board and its layering details.
Keywords :
electromagnetic compatibility; finite difference time-domain analysis; high-speed integrated circuits; integrated circuit interconnections; integrated circuit packaging; silicon; substrate integrated waveguides; Intel Corporation; SIW; bandpass waveguiding digital interconnect; bit rate 200 Gbit/s; circuit board technology; electromagnetic compatibility; finite-difference time-domain modeling; integrated circuit package; silicon photonic technology; substrate integrated waveguide; ultra high-resolution full-vector 3D FDTD model; ultracompact portable electronic device; ultrahigh-speed interconnects; Electromagnetic compatibility; Electromagnetic modeling; Electromagnetic waveguides; Fabrication; Finite difference methods; Integrated circuit interconnections; Integrated circuit modeling; Packaging; Printed circuits; Time domain analysis; EMC; FDTD; SIW interconnects;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Signal Integrity and High-Speed Interconnects, 2009. IMWS 2009. IEEE MTT-S International Microwave Workshop Series on
Conference_Location :
Guadalajara
Print_ISBN :
978-1-4244-2742-0
Electronic_ISBN :
978-1-4244-2743-7
Type :
conf
DOI :
10.1109/IMWS.2009.4814899
Filename :
4814899
Link To Document :
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