DocumentCode :
3153688
Title :
Practical technique for measurements of second-order nonlinearities in thermally poled glasses
Author :
Corbari, C. ; Deparis, O. ; Klappauf, B.G. ; Kazansky, P.G.
Author_Institution :
Optoelectron. Res. Centre, Southampton Univ., UK
fYear :
2003
fDate :
22-27 June 2003
Firstpage :
214
Abstract :
In this work we present a practical and nondestructive technique for measuring the thickness and the magnitude of χ(2) in thermally poled glasses. Theoretical analysis shows that thickness, as small as 4 μm, can be measured with less than 10% error. The resolution is estimated in about 1 μm. The technique is tested on a set of poled silica sample and the poling dynamic as well as the χ(2) evolution are derived.
Keywords :
dielectric polarisation; nonlinear optical susceptibility; optical glass; optical harmonic generation; silicon compounds; thickness measurement; χ(2) magnitude measurement; 4 micron; SiO2; nondestructive technique; poled silica sample; poling dynamic; resolution; second-order nonlinearities; thermally poled glasses; thickness measurement; Glass;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics Europe, 2003. CLEO/Europe. 2003 Conference on
Print_ISBN :
0-7803-7734-6
Type :
conf
DOI :
10.1109/CLEOE.2003.1312275
Filename :
1312275
Link To Document :
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