Title :
The State-of-the-art Of Thick Film Technology For Automotive Sensors
Author :
Wada, Takeshi ; Stein, Sidney J. ; Stein, Michael Alan ; Chitale, Sanjay M.
Keywords :
Automobiles; Automotive engineering; Control systems; Costs; Engines; Mechanical sensors; Temperature sensors; Thick film sensors; Thick films; Vehicle safety;
Conference_Titel :
IEMT/IMC Symposium, 1997., 1st [Joint International Electronic Manufacturing Symposium and the International Microelectronics Conference]
Conference_Location :
IEEE
Print_ISBN :
0-7803-4235-6
