DocumentCode :
3154739
Title :
Dealing with missing values for effective prediction of NPC recurrence
Author :
Kumdee, Orrawan ; Ritthipravat, Panrasee ; Bhongmakapat, Thongchai ; Cheewaruangroj, Wichit
Author_Institution :
Technol. of Inf. Syst. Manage., Mahidol Univ., Salaya
fYear :
2008
fDate :
20-22 Aug. 2008
Firstpage :
1290
Lastpage :
1294
Abstract :
This paper aims to investigate missing data techniques for effective prediction of nasopharyngeal carcinoma (NPC) recurrence. The techniques include listwise deletion, imputations by mean, k-nearest neighbor, and expectation maximization. The completed data are used to predict the presence or absence of NPC recurrence in each year by means of logistic regression, multilayer perceptron with backpropagation training, and naive bayes. Five year predictions are carried out. Validity of each predictive model is assured by 10-fold cross validation. Their results are compared in order to determine proper missing data treatment and the most efficient prediction technique. The results showed that EM imputation was superior to the other missing data techniques because it can be efficiently applied to all predictive models. The multilayer perceptron with backpropagation training gave the highest prediction performance and it was the most robust to the data completed by different missing data techniques.
Keywords :
backpropagation; cancer; expectation-maximisation algorithm; medical information systems; multilayer perceptrons; 10-fold cross validation; backpropagation training; expectation maximization; k-nearest neighbor; listwise deletion; logistic regression; missing data techniques; missing values; multilayer perceptron; naive bayes; nasopharyngeal carcinoma recurrence; predictive model; Backpropagation; Biomedical engineering; Cancer detection; Data engineering; Electronic mail; Hospitals; Multilayer perceptrons; Neural networks; Predictive models; Robustness; EM imputation; KNN imputation; Missing Data Techniques; nasopharyngeal carcinoma recurrence;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
SICE Annual Conference, 2008
Conference_Location :
Tokyo
Print_ISBN :
978-4-907764-30-2
Electronic_ISBN :
978-4-907764-29-6
Type :
conf
DOI :
10.1109/SICE.2008.4654856
Filename :
4654856
Link To Document :
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