DocumentCode :
3154873
Title :
A Unified Treatment of PLA Faults by Boolean Differences
Author :
Daehn, Wilfried
Author_Institution :
Institut fur Theoretische Elektrotechnik, Universitat Hannover, Hannover, West Germany
fYear :
1986
fDate :
29-2 June 1986
Firstpage :
334
Lastpage :
338
Abstract :
The calculation of test patterns for PLAs is an expensive and time consuming task if a general purpose test pattern generation programm is used. A unified treatment of faults in PLAs and a test pattern generation algorithm based on the calculation of Boolean differences is given in this paper. Calculating the difference between the Boolean functions of the faulty and the fault free circuit guarantees that a test for a given fault is found if it exists. By tayloring the algorithm to the specific structure of programmable logic arrays a powerful tool for the test pattern calculation for PLAs is obtained. An important feature of the method is the ease of incorporating different fault assumptions.
Keywords :
Boolean difference; PLA; cubical calculus; test pattern calculation; Boolean functions; Calculus; Circuit faults; Circuit testing; Equations; Logic arrays; Logic testing; Minimization; Programmable logic arrays; Test pattern generators; Boolean difference; PLA; cubical calculus; test pattern calculation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation, 1986. 23rd Conference on
ISSN :
0738-100X
Print_ISBN :
0-8186-0702-5
Type :
conf
DOI :
10.1109/DAC.1986.1586109
Filename :
1586109
Link To Document :
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