Title :
Methodology for optimizing gain and noise figure performance of CMOS LNAs at 60GHz and beyond
Author :
Yeo, Siok-Been ; Brinkhoff, James ; Lin, Fujiang ; Xu, Yong Ping
Author_Institution :
Inst. of Microelectonics, A*STAR, Singapore, Singapore
fDate :
Jan. 9 2009-Dec. 11 2009
Abstract :
This paper describes a technique of finding the noise figure of a 60 GHz LNA by extracting the equivalent noise resistance (Rn) of a MOSFET through on-wafer noise figure (F50) measurements at lower frequency (up to 18 GHz), while the other three noise parameters are extracted from S-parameter measurements beyond 60 GHz. This paper demonstrates how the gain-noise figure performance is optimized using extrapolated noise parameters and RF small signal models, with the measurement data (using 67 GHz noise source) closely matching the simulated noise figure (extracted using 18 GHz noise source) and gain performance at 60 GHz.
Keywords :
CMOS digital integrated circuits; S-parameters; integrated circuit noise; low noise amplifiers; microwave amplifiers; noise measurement; CMOS LNA; CMOS digital integrated circuit; MOSFET; RF small signal models; S-parameter measurements; equivalent noise resistance extraction; extrapolated noise parameters; frequency 60 GHz; gain optimisation; noise figure performance; on-wafer noise figure measurements; Data mining; Electrical resistance measurement; Frequency measurement; MOSFET circuits; Noise figure; Noise measurement; Optimization methods; Performance gain; Radio frequency; Scattering parameters; CMOS digital integrated circuits; LNA; gain; noise measurement;
Conference_Titel :
Radio-Frequency Integration Technology, 2009. RFIT 2009. IEEE International Symposium on
Conference_Location :
Singapore
Print_ISBN :
978-1-4244-5031-2
Electronic_ISBN :
978-1-4244-5032-9
DOI :
10.1109/RFIT.2009.5383709