• DocumentCode
    3155196
  • Title

    Exact sequence lengths in MASH digital delta-sigma modulators for fractional-N frequency synthesizers

  • Author

    Zheng, Jiajun ; Xue, Quan ; Muto, Fumio

  • Author_Institution
    Dept. of Electron. Eng., City Univ. of Hong Kong, Kowloon, China
  • fYear
    2009
  • fDate
    Jan. 9 2009-Dec. 11 2009
  • Firstpage
    119
  • Lastpage
    123
  • Abstract
    The formulae for calculating the exact sequence lengths of multi-stage noise shaping (MASH) digital delta-sigma modulator (DDSM) for any irreducible rational input constant without initial condition are presented in this paper. The sequence lengths are determined by the order of MASH DDSM and the denominator of the input. The factor of the sequence length as a function of the denominator of the input has period that is determined by the order of MASH DDSM. The periods of the factors of the sequence lengths are 1, 2, 6, 6, 30 and 30 for the first 6 orders respectively. The minimum sequence length is equal to the denominator of the input for all orders. The maximum sequence lengths are 1, 2, 6, 12, 60 and 60 times the denominator of the input for the first 6 orders respectively. The formulae provided are suitable for MASH DDSM of orders from 1 to 6 and can be extended to cover higher orders. The simulation and measurement results are provided to support our conclusions.
  • Keywords
    delta-sigma modulation; frequency synthesizers; MASH digital delta-sigma modulators; digital delta-sigma modulator; exact sequence lengths; fractional-N frequency synthesizers; multistage noise shaping; rational input constant; CMOS process; Delta modulation; Delta-sigma modulation; Frequency synthesizers; Genetic expression; Multi-stage noise shaping; Quantization; Radio frequency; Stability; Digital delta-sigma modulator(DDSM); Multistage noise shaping(MASH); exact sequence length; fractional-N frequency synthesizer;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radio-Frequency Integration Technology, 2009. RFIT 2009. IEEE International Symposium on
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4244-5031-2
  • Electronic_ISBN
    978-1-4244-5032-9
  • Type

    conf

  • DOI
    10.1109/RFIT.2009.5383716
  • Filename
    5383716