DocumentCode
3155458
Title
Mixed-Level Fault Coverage Estimation
Author
Ma, Hi Keung ; Vincentelli, Alberto L Sangiovanni
Author_Institution
Department of Electrical Engineering and Computer Sciences, University of California, Berkeley, CA
fYear
1986
fDate
29-2 June 1986
Firstpage
553
Lastpage
559
Abstract
A Fault coverage estimation technique for mixed-level circuit is described. Observability formulae for combinational multiple-input multiple-output functional block are derived. Special procedures for estimating CMOS circuit transistor fault detection probability are developed, and the implementation of a FAult Coverage Estimation (FACE) system is described.
Keywords
Circuit faults; Circuit simulation; Circuit testing; Computational modeling; Electrical fault detection; Face detection; Fault detection; MIMO; Observability; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation, 1986. 23rd Conference on
ISSN
0738-100X
Print_ISBN
0-8186-0702-5
Type
conf
DOI
10.1109/DAC.1986.1586142
Filename
1586142
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