DocumentCode
315910
Title
A built-in rule scan structure for analog fuzzy processors test and fault diagnosis
Author
Bellini, A. ; Rovatti, R. ; Franchi, E. ; Baccarani, G.
Author_Institution
Bologna Univ., Italy
Volume
2
fYear
1997
fDate
1-5 Jul 1997
Firstpage
773
Abstract
In this paper a novel methodology for testing dedicated analog fuzzy processors is presented. It relies on small additional hardware, and features independence from the actual input-output relationship of the processor and low time for the test scan. In fact validation time does not increase exponentially with the number of inputs, as it would with an exhaustive sampling of the input-output relationship. Some simulation results show that all the most likely faults are detected
Keywords
built-in self test; design for testability; fault diagnosis; fuzzy logic; fuzzy neural nets; fuzzy systems; analog fuzzy processors; built-in rule scan structure; exhaustive sampling; fault diagnosis; input-output relationship; simulation results; test diagnosis; test scan; Analog circuits; Circuit synthesis; Circuit testing; Computer architecture; Design for testability; Fault diagnosis; Hardware; Logic testing; Microelectronics; Software tools;
fLanguage
English
Publisher
ieee
Conference_Titel
Fuzzy Systems, 1997., Proceedings of the Sixth IEEE International Conference on
Conference_Location
Barcelona
Print_ISBN
0-7803-3796-4
Type
conf
DOI
10.1109/FUZZY.1997.622808
Filename
622808
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