• DocumentCode
    3159158
  • Title

    Estimation of Ricean and Nakagami distribution parameters using noisy samples

  • Author

    Chen, Yunfei ; Beaulieu, Norman C.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Alberta Univ., Edmonton, Alta., Canada
  • Volume
    1
  • fYear
    2004
  • fDate
    20-24 June 2004
  • Firstpage
    562
  • Abstract
    The problem of estimating the Ricean and Nakagami-m distribution parameters in noisy slowly fading channels is studied. Previous published works have mainly examined estimation based on a noiseless sample model. The predicted performances of these estimators can only be achieved by having knowledge of the values of the individual noise samples and subtracting them from the noisy signals, an impractical case. In this paper, a system model which uses samples corrupted by noise is examined. The probability density functions of noisy channel samples are derived. Novel maximum likelihood estimators as well as moment-based estimators for operation in noisy environments are developed based on these density functions. The sample means and sample root mean square errors of the estimators are determined. Numerical results show the new estimators have superior performances over estimators designed for noiseless samples in applications where noise is present.
  • Keywords
    Rician channels; channel estimation; maximum likelihood estimation; mean square error methods; multipath channels; probability; signal sampling; Nakagami-m distribution parameter; Ricean parameter estimation; maximum likelihood estimator; moment-based estimator; noise channel sample; noisy fading channel; probability density function; root mean square error estimator; Density functional theory; Fading; Maximum likelihood estimation; Nakagami distribution; Parameter estimation; Probability density function; Rayleigh channels; Root mean square; Wireless communication; Working environment noise;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Communications, 2004 IEEE International Conference on
  • Print_ISBN
    0-7803-8533-0
  • Type

    conf

  • DOI
    10.1109/ICC.2004.1312552
  • Filename
    1312552