Title :
An event-based approach to generate test scenarios
Author :
Sabharwal, Sangeeta ; Singh, Sandeep Kumar ; Sabharwal, Dhruv ; Gabrani, Aditya
Author_Institution :
NSIT, New Delhi, India
Abstract :
Testing is one of the most important and expensive activity in the software development life cycle. In order to save cost and time, model based testing approaches are used. In these approaches, software models like UML, SDL, Z, state diagrams, data flow diagrams, control flow diagrams, etc are used to derive test-cases and test scenarios. These software models specify the desired behaviour of the system under test (SUT). But using events is more logical way to model SUT of event-based systems. Thus, this paper presents a model-based testing approach for event-based systems using events as starting point. Events taking place in the SUT are documented in the proposed Event templates. An Event-flow model is built from event templates. Event-flow model is represented as Event-flow graph. Deep breath-first search is then applied on Event-flow graph to identify the test scenarios. The proposed technique can be very effective especially for real time systems where lots of events are taking place. The paper uses Automatic Production Environment case study to illustrate the entire process.
Keywords :
graph theory; program testing; tree searching; automatic production environment; deep breath-first search; event templates; event-based systems; event-flow graph; event-flow model; model-based testing approach; software development lifecycle; system under test; test scenario generation; Analytical models; Computational modeling; Computers; Object oriented modeling; Software; Testing; Unified modeling language; Event Flow Model; Event based coverage; Events; Software engineering; Testing; real Time systems;
Conference_Titel :
Computer and Communication Technology (ICCCT), 2010 International Conference on
Conference_Location :
Allahabad, Uttar Pradesh
Print_ISBN :
978-1-4244-9033-2
DOI :
10.1109/ICCCT.2010.5640469