DocumentCode :
3161195
Title :
Performance evaluation of high-voltage circuit breakers by means of current zero analysis
Author :
Smeets, Rene Peter Paul ; Kertesz, Viktor ; Nishiwaki, Susumu ; Suzuki, Katsumi
Author_Institution :
KEMA High-Power Lab., Arnhem, Netherlands
Volume :
1
fYear :
2002
fDate :
6-10 Oct. 2002
Firstpage :
424
Abstract :
Proper combination of fast, high-resolution analogue to digital converters, optical signal transfer and digital signal processing tools with advanced current and voltage measurement sensors has led to the development of a compact current zero measurement system for application in high-power laboratories as an aid in testing SF6 circuit breakers. The application of this system in the renovated high-power laboratory of Toshiba Co is described, including the results of short-line fault tests in the range 16-70 kA on a 300 kV single break model circuit breaker. Three levels of information on the ´quality of interruption´, obtained from current zero measurements are discussed: (1) direct observation of post-arc current, arc voltage collapse phenomena, commutation process of arc current into (stray-) capacitance etc.; (2) the arc conductivity very shortly (200 ns) before current zero, an indicator of the performance of the breaker under test. A new quantitative method of electrical endurance mapping is presented; and (3) arc model parameters are extracted out of every individual test, that enable prediction of the performance under other conditions than those tested (e.g. with an internal capacitor).
Keywords :
SF6 insulation; analogue-digital conversion; circuit breakers; circuit-breaking arcs; electric current measurement; signal processing; switchgear testing; voltage measurement; 16 to 70 kA; 300 kV; Toshiba; arc conductivity; arc current; arc model parameters extraction; arc voltage collapse phenomena; commutation process; current measurement sensors; current zero analysis; current zero measurements; digital signal processing tools; electrical endurance mapping; high-resolution analogue to digital converters; high-voltage circuit breakers; high-voltage techniques; optical signal transfer; performance evaluation; post-arc current; power transmission; quality of interruption; single break model circuit breaker; transient analysis; voltage measurement sensors; Analog-digital conversion; Circuit breakers; Circuit testing; Current measurement; Laboratories; Optical sensors; Optical signal processing; Performance analysis; Signal processing; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Transmission and Distribution Conference and Exhibition 2002: Asia Pacific. IEEE/PES
Print_ISBN :
0-7803-7525-4
Type :
conf
DOI :
10.1109/TDC.2002.1178398
Filename :
1178398
Link To Document :
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