Title :
Calibration Standards Verification Procedure Using the Calibration Comparison Technique
Author :
Rumiantsev, Andrej ; Doerner, Ralf ; Thies, Steffen
Author_Institution :
SUSS MicroTec Test Syst. GmbH, Sacka
Abstract :
This article examines the verification procedure of coplanar calibration standards based on the calibration comparison technique. For the first time, different commercially available alumina calibration substrates were compared using the NIST multiline TRL calibration procedure, calibration comparison approach, and the NIST GaAs CPW calibration reference material RM8130. The characteristic impedance of the verified calibration line standards is extracted using the multiline TRL procedure and the definition of the load standard resistance. The error circuit, describing difference of the substrate medium and the standard design is extracted. Finally, the worst case error bounds for the measurement of passive devices compared to the reference multiline TRL on the RM8130 are calculated for each tested substrate
Keywords :
III-V semiconductors; S-parameters; calibration; coplanar waveguides; gallium arsenide; measurement standards; microwave measurement; wide band gap semiconductors; CPW calibration reference material; GaAs; NIST; RM8130; alumina calibration substrates; calibration comparison technique; calibration standards verification; coplanar calibration standards; error circuit; multiline TRL calibration procedure; passive device measurement; scattering parameters measurement; standard resistance; Calibration; Coplanar waveguides; Fabrication; Gallium arsenide; Impedance; Measurement standards; Microwave devices; NIST; Scattering parameters; System testing; calibration; calibration comparison; error correction; scattering parameters measurement;
Conference_Titel :
Microwave Conference, 2006. 36th European
Conference_Location :
Manchester
Print_ISBN :
2-9600551-6-0
DOI :
10.1109/EUMC.2006.281416