DocumentCode :
3161472
Title :
Building Accuracies in Finite Element Models for Life Prediction of Solder Joints
Author :
Syed, Ahmer ; Kim, SeokBong ; Lin, Wei
Author_Institution :
Amkor Technol., Chandler
fYear :
2007
fDate :
10-12 Dec. 2007
Firstpage :
184
Lastpage :
191
Abstract :
With the rapid transition to Pb free solder in electronic industry, reliability of solder joints and life prediction has seen a renewed interest. Using the knowledge gained from modeling SnPb solder, a number of life prediction models have been suggested for SnAgCu based solder joints. These models are determined utilizing certain modeling assumptions and material behavior. Assuming accuracy in test data, the methodology used for calculating the strain or energy density is a significant source of error which limits the application of life prediction model. Since measuring inelastic strain or energy density in a tiny solder joint is not practical, these values are usually calculated using analytical or numerical approach. All simulation approaches use some assumptions, which can impact the accuracy of life prediction model. For finite element analysis, these assumptions include factors such as the level of structural details, 2-D or 3-D representation, mesh density, boundary conditions, and material models used. This paper presents how these factors affect the accuracy and efficiency of finite element based simulations when applied for solder joint life prediction. The modeling approaches previously published for temperature cycling and drop/impact loading by the author have been reviewed and enhanced by using advanced simulation techniques. The effect of meshing, material properties, and solder behavior under slow and fast loading conditions are investigated.
Keywords :
copper alloys; electronics packaging; finite element analysis; life testing; reliability; silver alloys; soldering; tin alloys; 2-D representation; 3-D representation; SnAgCu; drop-impact loading; electronic industry; energy density; finite element models; inelastic strain; package selection; solder joint reliability; solder joints life prediction; strain calculation; temperature cycling; Accuracy; Capacitive sensors; Density measurement; Electronics industry; Energy measurement; Finite element methods; Life testing; Predictive models; Soldering; Strain measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Packaging Technology Conference, 2007. EPTC 2007. 9th
Conference_Location :
Singapore
Print_ISBN :
978-1-4244-1323-2
Electronic_ISBN :
978-1-4244-1323-2
Type :
conf
DOI :
10.1109/EPTC.2007.4469763
Filename :
4469763
Link To Document :
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