Title :
Automatic transistor lead inspection
Author :
Hobson, C.A. ; Wong, K.L. ; Hamzah, S. ; Arshad, N.M. ; Abdullah, S.K.S.
Author_Institution :
Liverpool John Moores Univ., UK
Abstract :
This paper has described the development of a system for real-time inspection of transistor leads in a production environment. The system has been introduced into a factory in prototype form. This uses a transputer-based image processing system housed in an industrial PC and has given five months operational experience. Cost and other considerations require the production of an embedded system which will form part of the taping machine instrumentation and control system
Keywords :
automatic optical inspection; computerised instrumentation; edge detection; image processing equipment; microcomputer applications; real-time systems; semiconductor device manufacture; transistors; transputer systems; automatic transistor lead inspection; embedded system; image processing system; industrial PC; production environment; real-time inspection; transputer-based system;
Conference_Titel :
Image Processing and its Applications, 1995., Fifth International Conference on
Conference_Location :
Edinburgh
Print_ISBN :
0-85296-642-3
DOI :
10.1049/cp:19950693
