DocumentCode :
3161850
Title :
Influence of temperature and humidity on adhesion of underfills for flip chip packaging
Author :
Luo, Shijian ; Wong, C.P.
Author_Institution :
Sch. of Mater. Sci. & Eng., Georgia Inst. of Technol., Atlanta, GA, USA
fYear :
2001
fDate :
2001
Firstpage :
155
Lastpage :
162
Abstract :
This paper systematically discusses the influence of temperature and humidity on the adhesion performance of underfill material (epoxy cured with acid anhydride), evaluated by die shear test after exposure to various conditions. The adhesion strength between the underfill and passivation is not affected significantly by thermal cycling between -55°C and 125°C for 1000 cycles. The adhesion strength of underfill material decreases with the increase of test temperature above room temperature, due to the decrease of modulus of the underfill with the increase of temperature. A sharp decrease in adhesion strength occurs as temperature increase towards the glass transition temperature of the underfill material. Adhesion strength of underfill with different passivation materials decreases after aging in a high temperature and high humidity environment. The extent of this decrease is dependent on the chemistry of underfill formulation and the hydrophilicity of the passivation material. Hydrophilic passivation such silicon oxide (SiO 2) and silicon nitride (SiN) shows much more severe adhesion degradation than hydrophobic passivation such as benzocyclobutene (BCB) and polyimide (PI). Adhesion degradation kinetics is discussed in terms of mobility of polymer chains and of absorbed water. The adhesion stability for hydrophilic passivation can be successfully improved by use of a coupling agent such as silane that introduces stable chemical bond at interface
Keywords :
adhesion; encapsulation; flip-chip devices; glass transition; integrated circuit packaging; passivation; polymers; -55 to 125 C; SiN; SiO2; absorbed water mobility; acid anhydride curing; adhesion degradation kinetics; adhesion stability; adhesion strength; benzocyclobutene; die shear test; epoxy resin; flip-chip packaging; glass transition temperature; humidity effect; hydrophilic passivation; hydrophobic passivation; interfacial chemical bonding; polyimide; polymer chain mobility; silane coupling agent; silicon nitride; silicon oxide; temperature effect; thermal cycling; underfill material; Adhesives; Aging; Chemistry; Glass; Humidity; Materials testing; Passivation; Silicon; System testing; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 2001. Proceedings., 51st
Conference_Location :
Orlando, FL
ISSN :
0569-5503
Print_ISBN :
0-7803-7038-4
Type :
conf
DOI :
10.1109/ECTC.2001.927711
Filename :
927711
Link To Document :
بازگشت