Title :
The influence of a compact test circuit in the puncture test
Author :
De Mello, Darcy Ramalho ; Rodrigues, José Antonio P ; Cardoso, José Antonio D Affonseca ; de Assis A F Vieira, Francisco
Author_Institution :
Lines & Equip. Dept., CEPEL, Rio de Janeiro, Brazil
Abstract :
The objective of this paper is to present the experience of CEPEL´s laboratory in the puncture test (since 1984) showing the advantages to use a compact test circuit with short dimensions very fast resistive divider, the use of an encapsulated sphere-gap to guarantee the linearity of the spark, reducing the charging voltage and the wearing of the impulse capacitor. This experience is important because several test laboratories around the world had stopped to perform the puncture test due to problems in their impulse generators or problems to obtain the real test voltage due to wrong measuring systems. This paper also presents the results obtained when performing a puncture test on a short standard string.
Keywords :
circuit testing; test equipment; compact test circuit; encapsulated sphere-gap; puncture test; resistive divider; Coils; Generators; Glass; IEC standards; Insulators; Laboratories; Voltage measurement;
Conference_Titel :
High Voltage Engineering and Application (ICHVE), 2010 International Conference on
Conference_Location :
New Orleans, LA
Print_ISBN :
978-1-4244-8283-2
DOI :
10.1109/ICHVE.2010.5640707
