DocumentCode :
3162316
Title :
Degradation behavior of Ca-doped barium titanate ceramic capacitors
Author :
Huh, Min ; Cho, Kyeong Ho ; Nam, Hyo-Duk ; Lee, Hee Young
Author_Institution :
Dept. of Electron. Eng., Yeungnam Univ., Kyongsan, South Korea
fYear :
1991
fDate :
33457
Firstpage :
572
Lastpage :
576
Abstract :
Electrical degradation of calcium-containing MLCCs having nickel internal electrode was studied using a highly accelerated life test set-up. Both extrinsic and intrinsic failures were identified in commercial MLCCs. From the estimated values of degradation parameters such as voltage exponent factor and pseudo-activation energy, it was found that the intrinsic failure took place by thermal runaway. Although, the degradation pattern for nickel electrode MLCCs was similar to that for common palladium electrode MLCCs, the maximum rated lifetime of the former was in the range of 5 to 30 years and was, in general, shorter than that of the latter. This difference was ascribed to the difference in oxygen vacancy concentrations. Thus, possible degradation mechanisms should be related to oxygen vacancy movement. Among them are reduction model, grain boundary barrier model and de-mixing model
Keywords :
barium compounds; calcium; ceramic capacitors; electron device testing; failure analysis; ferroelectric capacitors; grain boundary diffusion; life testing; nickel; vacancies (crystal); 5 to 30 y; BaTiO3:Ca-Ni; Ca-doped barium titanate ceramic capacitors; accelerated life test; calcium-containing MLCC; de-mixing model; degradation behavior; electrical degradation; extrinsic failure; grain boundary barrier model; intrinsic failure; maximum rated lifetime; nickel internal electrode; oxygen vacancy concentrations; pseudo-activation energy; reduction model; thermal runaway; voltage exponent factor; Barium; Capacitors; Ceramics; Electrodes; Life estimation; Life testing; Nickel; Thermal degradation; Titanium compounds; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Applications of Ferroelectrics, 1994.ISAF '94., Proceedings of the Ninth IEEE International Symposium on
Conference_Location :
University Park, PA
Print_ISBN :
0-7803-1847-1
Type :
conf
DOI :
10.1109/ISAF.1994.522433
Filename :
522433
Link To Document :
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