DocumentCode :
3163845
Title :
Characterization Accuracy of High-Q Reactors Using Broadband Reflection/Transmission Measurement Techniques
Author :
Deleniv, A. ; Gevorgian, S.
Author_Institution :
Dept. of Microtechnology & Nanoscience, Chalmers Univ. of Technol., Goteborg
fYear :
2006
fDate :
10-15 Sept. 2006
Firstpage :
975
Lastpage :
978
Abstract :
Characterization accuracy of high-Q reactors due to measurement uncertainties is analyzed in this paper. Two broadband techniques based on reflection and transmission type measurements are considered. A differential calculus combined with an equivalent circuit representation of the measurement error are used here to derive simple analytic formulas. It is shown that the accuracy of calibrated VNA is insufficient to obtain accurate loss data. A measurement procedure is proposed that improves the accuracy of loss measurement. A measurement example is given demonstrating the utility of the above approach
Keywords :
Q-factor; capacitors; equivalent circuits; inductors; loss measurement; measurement errors; measurement uncertainty; microwave measurement; network analysers; broadband reflection measurement; broadband transmission measurement; differential calculus; equivalent circuit representation; high-Q reactors; loss measurement; measurement error; measurement uncertainties; vector network analyzer; Admittance measurement; Capacitance measurement; Equivalent circuits; Inductors; Loss measurement; Measurement errors; Measurement techniques; Measurement uncertainty; Microwave theory and techniques; Reflection;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Conference, 2006. 36th European
Conference_Location :
Manchester
Print_ISBN :
2-9600551-6-0
Type :
conf
DOI :
10.1109/EUMC.2006.281085
Filename :
4057984
Link To Document :
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